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Volumn 41, Issue 3, 2008, Pages 221-227

Electrical properties and transport mechanisms of p-znte/n-si heterojunctions

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); EVAPORATION; SILICON WAFERS; SUBSTRATES;

EID: 42149185567     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2008025     Document Type: Article
Times cited : (14)

References (31)
  • 5
    • 42149179037 scopus 로고    scopus 로고
    • P.C. Kalita, K.C. Sarma, H.L. Das, J. Assam Sci. Soc. 39, 117 (1998)
    • P.C. Kalita, K.C. Sarma, H.L. Das, J. Assam Sci. Soc. 39, 117 (1998)
  • 18
    • 42149098569 scopus 로고    scopus 로고
    • S. Tolansky, Multiple-bem, Interferometry of Surface and Films (London, Oxford, 1988), 147
    • S. Tolansky, Multiple-bem, Interferometry of Surface and Films (London, Oxford, 1988), 147


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.