The structural, optical, and electrical properties of vacuum evaporated Cu-doped ZnTe polycrystalline thin films

Journal of Electronic Materials

Volumn 25, Issue 9, 1996, Pages 1422-1427

  Feng, L ^a,b   Mao, D ^a   Tang, J ^a   Collins, R T ^a   Trefny, J U ^a  

^a Department of Geology and Geological Engineering   (United States)

^b SICHUAN UNIVERSITY   (China)

Author keywords

II VI semiconductor; Polycrystalline thin films; ZnTe

Indexed keywords

EID: 0000778118     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655377     Document Type: Article

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