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Thin Solid Films

Volumn 343-344, Issue 1-2, 1999, Pages 508-511

Ohmic contacts to p-type ZnTe using electroless Pd

(3) Nishio, Mitsuhiro a Guo, Qixin a Ogawa, Hiroshi a

a SAGA UNIVERSITY (Japan)

Author keywords

Auger depth profile; Electroless deposition; Ohmic contact; p ZnTe; Pd

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTROLESS PLATING; OHMIC CONTACTS; PALLADIUM ALLOYS; SEMICONDUCTING ZINC COMPOUNDS; SPUTTER DEPOSITION;

AUGER SPUTTER DEPTH PROFILES;

THIN FILMS;

EID: 0032669139 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)01692-7 Document Type: Article

Times cited : (38)

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