Defects in ZnSe/ZnTe multiple quantum well-based pseudo-ohmic contacts to p-ZnSe

Journal of Applied Physics

Volumn 86, Issue 7, 1999, Pages 3616-3623

  Tomiya, S ^a   Kijima, S ^a   Okuyama, H ^a   Tsukamoto, H ^a   Hino, T ^a   Taniguchi, S ^a   Noguchi, H ^a   Kato, E ^a   Ishibashi, A ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; OHMIC CONTACTS; SEMICONDUCTING TELLURIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

LOMER DISLOCATIONS; ZINC SELENIDE; ZINC TELLURIDE;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032606634     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371269     Document Type: Article

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