Line length dependence of threshold current density and driving force in eutectic SnPb and SnAgCu solder electromigration

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Yoon, Min Seung ^a   Ko, Min Ku ^a   Kim, Bit Na ^a   Kim, Byung Joon ^a   Park, Yong Bae ^b   Joo, Young Chang ^a  

^a Seoul National University   (South Korea)

^b Andong National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; ELECTROMIGRATION; EUTECTICS; THRESHOLD CURRENT DENSITY;

CHEMICAL DRIVING FORCE; LINE LENGTH DEPENDENCE;

SOLDERING ALLOYS;

EID: 42149108027     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2890412     Document Type: Article

References (20)

1. S. Brandenburg and S. Yeh, Proceedings of the Surface Mount International Conference and Exposition, San Jose, CA, 1998 (unpubilshed), p. 337.
2. I. A. Blech and C. Herring, Appl. Phys. Lett. 29, 131 (1976).
3. M. A. Korhonen, P. Borgesen, K. N. Tu, and C.-Y. Li, J. Appl. Phys. 73, 15 (1993).
4. J. R. Lloyd, J. Phys. D 32, R109 (1999).
5. J. Proost, K. Maex, and L. Delaey, Appl. Phys. Lett. 73, 2748 (1998).
6. J. R. Kraayeveld, A. H. Verbruggen, A. W.-J. Willemsen, and S. Radelaan, Appl. Phys. Lett. 67, 28 (1995).
7. I. A. Blech, Acta Mater. 46, 2717 (1998).
8. R. G. Filippi, G. A. Biery, and R. A. Wachnik, J. Appl. Phys. 78, 3756 (1995).
9. Y. T. Yeh, C. K. Chou, Y. C. Hsu, C. Chen, and K. N. Tu, Appl. Phys. Lett. 86, 203504 (2005).
10. R. Agarwal, S. E. Ou, and K. N. Tu, J. Appl. Phys. 100, 024909 (2006).
11. C. C. Wei and C. Chen, Appl. Phys. Lett. 88, 182105 (2006).
12. Y.-C. Hsu, C. K. Chou, P. C. Liu, C. Chen, D. J. Yao, T. Chou, and K. N. Tu, J. Appl. Phys. 98, 033523 (2005).
13. H. C. Yu, S. H. Liu, and C. Chen, J. Appl. Phys. 98, 013540 (2005).
14. M.-S. Yoon, S.-B. Lee, O.-H. Kim, Y.-B. Park, and Y.-C. Joo, J. Appl. Phys. 100, 033715 (2006).
15. M.-S. Yoon, M.-K. Ko, O.-H. Kim, Y.-B. Park, W. D. Nix, and Y.-C. Joo, J. Electron. Mater. (to be published).
16. J.-Y. Choi, S.-S. Lee, and Y.-C. Joo, Jpn. J. Appl. Phys., Part 1 41, 7487 (2002).
17. Y.-J. Park, V. K. Andleigh, and C. V. Thompson, J. Appl. Phys. 85, 3546 (1999).
18. Q. T. Huynh, C. Y. Liu, C. Chen, and K. N. Tu, J. Appl. Phys. 89, 4332 (2001).
19. K. N. Tu, J. Appl. Phys. 94, 5451 (2003).
20. A. T. Huang, A. M. Gusak, K. N. Tu, and Y.-S. Lai, Appl. Phys. Lett. 88, 141911 (2006).