Electromigration in integrated circuit conductors

Journal of Physics D: Applied Physics

Volumn 32, Issue 17, 1999, Pages

  Lloyd, J R ^a  

^a Lloyd Technology Associates Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRIC CURRENTS; ELECTROMIGRATION; THERMAL STRESS; THERMODYNAMICS;

INTEGRATED CIRCUIT CONDUCTORS;

INTEGRATED CIRCUITS;

EID: 0032668835     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/17/201     Document Type: Article

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