Critical length of electromigration for eutectic SnPb solder stripe

Applied Physics Letters

Volumn 88, Issue 18, 2006, Pages

  Wei, C C ^a   Chen, Chih ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; EUTECTICS; ION BEAMS; STRESS ANALYSIS;

CRITICAL LENGTH; SOLDER STRIPES; STRESSING;

SOLDERING ALLOYS;

EID: 33646499014     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2200158     Document Type: Article

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