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Volumn 1, Issue , 2006, Pages 1036-1039

High-quality surface passivation obtained by high-rate deposited silicon nitride, silicon dioxide and amorphous silicon using the versatile expanding thermal plasma technique

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANTIREFLECTION COATINGS; DEPOSITION RATES; PASSIVATION; SILICON NITRIDE;

EID: 41749095884     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279296     Document Type: Conference Paper
Times cited : (5)

References (16)
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    • Dauwe, S.1    Mittelstadt, L.2    Metz, A.3    Hezel, R.4
  • 2
    • 0036948749 scopus 로고    scopus 로고
    • Very low surface recombination velocities on p- and n-type silicon wafers passivated with hydrogenated amorphous silicon films
    • New Orleans
    • Dauwe, S., J. Schmidt, and R. Hezel. "Very low surface recombination velocities on p- and n-type silicon wafers passivated with hydrogenated amorphous silicon films". 29th IEEE Photovoltaic Specialist Conference. 2002. New Orleans, 1246.
    • (2002) 29th IEEE Photovoltaic Specialist Conference , pp. 1246
    • Dauwe, S.1    Schmidt, J.2    Hezel, R.3
  • 3
    • 0035475390 scopus 로고    scopus 로고
    • Surface passivation of p-type crystalline Si by plasma enhanced chemical vapor deposited amorphous SiCx : H films
    • Martin, I., M. Vetter, A. Orpella, J. Puigdollers, A. Cuevas, and R. Alcubilla, "Surface passivation of p-type crystalline Si by plasma enhanced chemical vapor deposited amorphous SiCx : H films", Applied Physics Letters, 79, 2001, pp. 2199.
    • (2001) Applied Physics Letters , vol.79 , pp. 2199
    • Martin, I.1    Vetter, M.2    Orpella, A.3    Puigdollers, J.4    Cuevas, A.5    Alcubilla, R.6
  • 6
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data
    • Sinton, R.A. and A. Cuevas, "Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data", Applied Physics Letters, 69, 1996, pp. 2510.
    • (1996) Applied Physics Letters , vol.69 , pp. 2510
    • Sinton, R.A.1    Cuevas, A.2
  • 7
    • 0242497608 scopus 로고    scopus 로고
    • Influence of the high-temperature "firing" step on high-rate plasma deposited silicon nitride films used as bulk passivating antireflection coatings on silicon solar cells
    • Hong, J., W.M.M. Kessels, W.J. Soppe, A.W. Weeber, W.M. Amoldbik, and M.C.M. van de Sanden, "Influence of the high-temperature "firing" step on high-rate plasma deposited silicon nitride films used as bulk passivating antireflection coatings on silicon solar cells", Journal of Vacuum Science & Technology B, 21, 2003, pp. 2123.
    • (2003) Journal of Vacuum Science & Technology B , vol.21 , pp. 2123
    • Hong, J.1    Kessels, W.M.M.2    Soppe, W.J.3    Weeber, A.W.4    Amoldbik, W.M.5    van de Sanden, M.C.M.6
  • 9
    • 0842269051 scopus 로고    scopus 로고
    • High-quality surface passivation of silicon solar cells in an industrial-type inline plasma silicon nitride deposition system
    • Moschner, J.D., J. Henze, J. Schmidt, and R. Hezel, "High-quality surface passivation of silicon solar cells in an industrial-type inline plasma silicon nitride deposition system", Progress in Photovoltaics, 12, 2004, pp. 21-31.
    • (2004) Progress in Photovoltaics , vol.12 , pp. 21-31
    • Moschner, J.D.1    Henze, J.2    Schmidt, J.3    Hezel, R.4
  • 10
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    • The effect of low and high temperature anneals on the hydrogen content and passivation of Si surface coated with SiO2 and SiN films
    • Ebong, A., P. Doshi, S. Narasimha, A. Rohatgi, J. Wang, and M.A. El-Sayed, "The effect of low and high temperature anneals on the hydrogen content and passivation of Si surface coated with SiO2 and SiN films", Journal of the Electrochemical Society, 146, 1999, pp. 1921.
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  • 15
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    • (2005) Progress in Photovoltaics , vol.13 , pp. 381
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.