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Volumn 516, Issue 11, 2008, Pages 3512-3516

Infinitely high etch selectivity during CH4/H2/Ar inductively coupled plasma (ICP) etching of indium tin oxide (ITO) with photoresist mask

Author keywords

Inductively coupled plasma; Infinite etch selectivity; ITO; Plasma etching

Indexed keywords

CHEMICAL REACTIONS; INDUCTIVELY COUPLED PLASMA; PLASMA ETCHING;

EID: 40649098622     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.08.021     Document Type: Article
Times cited : (18)

References (23)
  • 15
    • 0032320757 scopus 로고    scopus 로고
    • Kuo Y. Vacuum 51 (1998) 777
    • (1998) Vacuum , vol.51 , pp. 777
    • Kuo, Y.1
  • 19
    • 40649083433 scopus 로고    scopus 로고
    • Kuo Y. (Ed), Kluwer, Boston
    • Kuo Y. In: Kuo Y. (Ed). Thin Film Transistors. Materials and Processes Vol.1 (2004), Kluwer, Boston 297
    • (2004) Materials and Processes , vol.1 , pp. 297
    • Kuo, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.