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Volumn 82, Issue 11, 1997, Pages 5422-5432

Localized absorption effects during 351 nm, pulsed laser irradiation of dielectric multilayer thin films

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EID: 0001079224     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365570     Document Type: Article
Times cited : (63)

References (16)
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    • ANSYS, Inc., P.O. Box 65, Johnson Road, Houston, PA 15342-0065
    • ANSYS, Inc., P.O. Box 65, Johnson Road, Houston, PA 15342-0065.


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