Photothermal mapping of defects in the study of bulk damage in KDP

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3244, Issue , 1997, Pages 242-248

  Woods, B ^a   Yan, M ^a   DeYoreo, J ^a   Kozlowski, M ^a   Radousky, H ^a   Wu, Z ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Bulk damage; DKDP; KDP; Photothermal deflection

Indexed keywords

CRYSTAL LATTICES; HEATING; LASER DAMAGE; LIGHT SCATTERING; OPTICAL SWITCHES;

PHOTOTHERMAL MAPPING;

CRYSTAL DEFECTS;

EID: 0031289612     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.307033     Document Type: Conference Paper

References (10)

1. Investigation of damage in KDP using light scattering techniques
2. Transverse stimulated raman scattering in KDP
3. The thermal lens in absorption spectroscopy
4. Photothermal deflection spectroscopy and detection
5. Photothermal characterization of optical thin films
6. Investigation of impurities and laser induced damage in the growth sectors of rapidly grown KDP crystals
7. High temperature phase transitions and metastablility in KDP type crystals