Degradation of spectral response and dark current of CMOS image sensors in deep-submicron technology due to γ-irradiation

ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

Volumn 2007, Issue , 2007, Pages 370-373

  Rao, Padmakumar R ^a   Wang, Xinyang ^a   Theuwissen, Albert J P ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DALSA Inc   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; GAMMA RAYS; IRRADIATION; RADIATION DAMAGE; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS;

CMOS IMAGE SENSORS; SHALLOW TRENCH ISOLATIONS; SPECTRAL DEGRADATION; SUBMICRON TECHNOLOGY;

IMAGE SENSORS;

EID: 39549107335     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2007.4430955     Document Type: Conference Paper

References (11)

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