SCOPUS 정보 검색 플랫폼

Optical Materials

Volumn 30, Issue 7, 2008, Pages 1017-1022

Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films

(6) Aulika, I a Pokorny, J b Zauls, V a Kundzins, K a Rutkis, M a Petzelt, J b

a UNIVERSITY OF LATVIA (Latvia)

b INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

Ferroelectric; Internal stress; Optical properties; Raman scattering; Structure; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC FILMS; LASER ABLATION; PULSED LASER DEPOSITION; RAMAN SCATTERING; REFRACTIVE INDEX; SURFACE ROUGHNESS; THIN FILMS;

INTERNAL STRESS; ROOM TEMPERATURE;

BARIUM COMPOUNDS;

EID: 39449106744 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2007.05.004 Document Type: Article

Times cited : (15)

References (47)

1
- 0021515230
- Gunther K.H. Appl. Opt. 23 (1984) 3612
- (1984) Appl. Opt. , vol.23 , pp. 3612
- Gunther, K.H.¹

2
- 0001332104
- Granqvist C.G., and Hunderi O. Phys. Rev. B 16 (1977) 3513
- (1977) Phys. Rev. B , vol.16 , pp. 3513
- Granqvist, C.G.¹ Hunderi, O.²

3
- 0000655143
- Chang W., Gilmore C.M., Kim W.-J., Pond J.M., et al. J. Appl. Phys. 87 (2000) 3044
- (2000) J. Appl. Phys. , vol.87 , pp. 3044
- Chang, W.¹ Gilmore, C.M.² Kim, W.-J.³ Pond, J.M.⁴

4
- 36449008301
- Yamamichi S., Yabuta H., Sukuma T., and Miyasaka Y. Appl. Phys. Lett. 64 (1994) 1644
- (1994) Appl. Phys. Lett. , vol.64 , pp. 1644
- Yamamichi, S.¹ Yabuta, H.² Sukuma, T.³ Miyasaka, Y.⁴

5
- 0001947284
- Xu Y.H., and Mackenzie J.D. Integr. Ferroelectr. 1 (1992) 17
- (1992) Integr. Ferroelectr. , vol.1 , pp. 17
- Xu, Y.H.¹ Mackenzie, J.D.²

6
- 0000547908
- Hou S.Y., Kwo J., Watts R.K., and Cheng J.Y. Appl. Phys. Lett. 67 (1995) 1387
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1387
- Hou, S.Y.¹ Kwo, J.² Watts, R.K.³ Cheng, J.Y.⁴

7
- 0000750478
- Kamalasanan M.N., and Chandra S. Appl. Phys. Lett. 59 (1991) 3547
- (1991) Appl. Phys. Lett. , vol.59 , pp. 3547
- Kamalasanan, M.N.¹ Chandra, S.²

8
- 36749120484
- Wohlecke M., Marrello V., and Onton A. J. Appl. Phys. 48 (1997) 1748
- (1997) J. Appl. Phys. , vol.48 , pp. 1748
- Wohlecke, M.¹ Marrello, V.² Onton, A.³

9
- 0032476242
- Panda B., Dhar A., Nigan G.D., Bhattacharga D., and Ray S.K. Thin Solid Films 332 (1998) 46
- (1998) Thin Solid Films , vol.332 , pp. 46
- Panda, B.¹ Dhar, A.² Nigan, G.D.³ Bhattacharga, D.⁴ Ray, S.K.⁵

10
- 0027610064
- Kim T.S., Oh M.H., and Kim C.H. Jpn. J. Appl. Phys. 32 (1993) 2837
- (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 2837
- Kim, T.S.¹ Oh, M.H.² Kim, C.H.³

11
- 0004969651
- Lariviere G.P., Frigerio J.M., Rivory J., and Abeles F. Appl. Opt. 31 (1992) 6509
- (1992) Appl. Opt. , vol.31 , pp. 6509
- Lariviere, G.P.¹ Frigerio, J.M.² Rivory, J.³ Abeles, F.⁴

12
- 0021515165
- Borgogno J.P., Flory F., Roche P., Schmitt B., Albrand G., et al. Appl. Opt. 23 (1984) 3567
- (1984) Appl. Opt. , vol.23 , pp. 3567
- Borgogno, J.P.¹ Flory, F.² Roche, P.³ Schmitt, B.⁴ Albrand, G.⁵

13
- 0024717214
- Zakharchenko I.N., Nikitin E.S., et al. Phys. Stat. Sol. A 114 (1989) 559
- (1989) Phys. Stat. Sol. A , vol.114 , pp. 559
- Zakharchenko, I.N.¹ Nikitin, E.S.²

14
- 0000084660
- Baumert B.A., Chang L.-H., Matsuda A.T., et al. J. Appl. Phys. 82 (1997) 2558
- (1997) J. Appl. Phys. , vol.82 , pp. 2558
- Baumert, B.A.¹ Chang, L.-H.² Matsuda, A.T.³

15
- 33744562690
- Streiffer S.K., Basceri C., Parker C.B., et al. J. Appl. Phys. 86 (1999) 4665
- (1999) J. Appl. Phys. , vol.86 , pp. 4665
- Streiffer, S.K.¹ Basceri, C.² Parker, C.B.³

16
- 0027608754
- Mehrotra V., Kaplan S., Sievers A.J., and Giannelis E.P. J. Mater. Res. 8 (1993) 1209
- (1993) J. Mater. Res. , vol.8 , pp. 1209
- Mehrotra, V.¹ Kaplan, S.² Sievers, A.J.³ Giannelis, E.P.⁴

17
- 0031212072
- Tcheliebou F., Ryu H.S., Hong C.K., Park W.S., and Baik S. Thin Solid Films 305 (1997) 30
- (1997) Thin Solid Films , vol.305 , pp. 30
- Tcheliebou, F.¹ Ryu, H.S.² Hong, C.K.³ Park, W.S.⁴ Baik, S.⁵

18
- 0030257478
- Mohammed M.S., Naik R., Mantese J.V., Schubring N.W., et al. J. Mater. Res. 11 (1996) 2588
- (1996) J. Mater. Res. , vol.11 , pp. 2588
- Mohammed, M.S.¹ Naik, R.² Mantese, J.V.³ Schubring, N.W.⁴

19
- 0006830470
- Raham M.M., Yu G.L., Krishna K.M., Soga T., et al. M Appl. Opt. 37 (1998) 691
- (1998) M Appl. Opt. , vol.37 , pp. 691
- Raham, M.M.¹ Yu, G.L.² Krishna, K.M.³ Soga, T.⁴

20
- 0014811159
- Burns G., and Scott B.A. Phys. Rev. Lett. 25 (1970) 167
- (1970) Phys. Rev. Lett. , vol.25 , pp. 167
- Burns, G.¹ Scott, B.A.²

21
- 0017456925
- Scalabrin A., Chaves A.S., Shim D.S., and Porto S.P.S. Phys. Status Solidi 79 (1977) 731
- (1977) Phys. Status Solidi , vol.79 , pp. 731
- Scalabrin, A.¹ Chaves, A.S.² Shim, D.S.³ Porto, S.P.S.⁴

22
- 0030232799
- Kojima S., Ikeuchi Y., Zhunchang H., and Qingrui Y. Jpn. J. Appl. Phys. 1 35 (1996) 5192
- (1996) Jpn. J. Appl. Phys. 1 , vol.35 , pp. 5192
- Kojima, S.¹ Ikeuchi, Y.² Zhunchang, H.³ Qingrui, Y.⁴

23
- 0000138175
- Taguchi I., Pignolet A., Wang L., Proctor M., et al. J. Appl. Phys. 73 (1993) 394
- (1993) J. Appl. Phys. , vol.73 , pp. 394
- Taguchi, I.¹ Pignolet, A.² Wang, L.³ Proctor, M.⁴

24
- 0001610328
- Robins L.H., Kaiser D.L., Rotter L.D., Schenck P.K., et al. J. Appl. Phys. 76 (1994) 7487
- (1994) J. Appl. Phys. , vol.76 , pp. 7487
- Robins, L.H.¹ Kaiser, D.L.² Rotter, L.D.³ Schenck, P.K.⁴

25
- 0001013090
- Yuzyuk Y.I., Farhi R., Lorman V.L., Rabkin L.M., et al. J. Appl. Phys. 84 (1998) 452
- (1998) J. Appl. Phys. , vol.84 , pp. 452
- Yuzyuk, Y.I.¹ Farhi, R.² Lorman, V.L.³ Rabkin, L.M.⁴

26
- 0032606527
- Dobal P.S., Bhaskar S., Majumder S.B., and Katiyar R.S. J. Appl. Phys. 86 (1999) 828
- (1999) J. Appl. Phys. , vol.86 , pp. 828
- Dobal, P.S.¹ Bhaskar, S.² Majumder, S.B.³ Katiyar, R.S.⁴

27
- 0004139061
- University Press, Cambridge
- Born M., and Wolf E. Principles of Optics. seventh extended ed. (1991), University Press, Cambridge
- (1991) Principles of Optics. seventh extended ed.
- Born, M.¹ Wolf, E.²

28
- 0035335261
- Bosch S., Ferre-Borrull J., and Sancho-Parramon J. Solid State Elec. 45 (2001) 703
- (2001) Solid State Elec. , vol.45 , pp. 703
- Bosch, S.¹ Ferre-Borrull, J.² Sancho-Parramon, J.³

29
- 36449004405
- Göddenhenrich T., Müller S., and Heiden C. Rev. Sci. Instrum. 65 9 (1994) 2870
- (1994) Rev. Sci. Instrum. , vol.65 , Issue.9 , pp. 2870
- Göddenhenrich, T.¹ Müller, S.² Heiden, C.³

30
- 0015626044
- Quittet A.M., and Lambert M. Solid State Commun. 12 (1973) 1053
- (1973) Solid State Commun. , vol.12 , pp. 1053
- Quittet, A.M.¹ Lambert, M.²

31
- 0000260872
- Naik R., Nazarko J.J., Flattery C.S., Venkateswaran U.D., et al. Phys. Rev. B 61 (2000) 11367
- (2000) Phys. Rev. B , vol.61 , pp. 11367
- Naik, R.¹ Nazarko, J.J.² Flattery, C.S.³ Venkateswaran, U.D.⁴

32
- 0036538570
- Yuzyuk Yu.I., Alyoshin V.A., et al. Phys. Rev. B 65 (2002) 134107
- (2002) Phys. Rev. B , vol.65 , pp. 134107
- Yuzyuk, Yu.I.¹ Alyoshin, V.A.²

33
- 33746288103
- Katiyar R.S., Jain M., and Yuzyuk YU.I. Ferroelectrics 303 (2004) 101
- (2004) Ferroelectrics , vol.303 , pp. 101
- Katiyar, R.S.¹ Jain, M.² Yuzyuk, YU.I.³

34
- 0002397367
- Fontana M.P., and Lambert M. Solid State Commun. 10 (1972) 1
- (1972) Solid State Commun. , vol.10 , pp. 1
- Fontana, M.P.¹ Lambert, M.²

35
- 0001452660
- Burns G., and Dacol F.H. Phys. Rev. B 18 (1978) 5750
- (1978) Phys. Rev. B , vol.18 , pp. 5750
- Burns, G.¹ Dacol, F.H.²

36
- 0037284663
- Tenne D.A., Soukiassian A., et al. Phys. Rev. B 67 (2003) 012302-1
- (2003) Phys. Rev. B , vol.67 , pp. 012302-012301
- Tenne, D.A.¹ Soukiassian, A.²

37
- 0035820782
- Tian H.Y., Luo W.G., Pu1 X.H., He1 X.Y., et al. J. Phys.: Condens. Matter. 13 (2001) 4065
- (2001) J. Phys.: Condens. Matter. , vol.13 , pp. 4065
- Tian, H.Y.¹ Luo, W.G.² Pu1, X.H.³ He1, X.Y.⁴

38
- 33846916776
- Wemple S.H. J. Chem. Phys. 67 (1977) 2151
- (1977) J. Chem. Phys. , vol.67 , pp. 2151
- Wemple, S.H.¹

39
- 0036572616
- Pontes F.M., Leite E.R., et al. J. Appl. Phys. 91 9 (2002) 5972
- (2002) J. Appl. Phys. , vol.91 , Issue.9 , pp. 5972
- Pontes, F.M.¹ Leite, E.R.²

40
- 0037394841
- Zhang T., Gu H., and Liu J. Microelectr. Eng. 66 1-4 (2003) 860
- (2003) Microelectr. Eng. , vol.66 , Issue.1-4 , pp. 860
- Zhang, T.¹ Gu, H.² Liu, J.³

41
- 0031152683
- Thielsch R., Kaemmer K., et al. Thin Sol. Films 301 (1997) 203
- (1997) Thin Sol. Films , vol.301 , pp. 203
- Thielsch, R.¹ Kaemmer, K.²

42
- 0000263765
- Akimov I.A., Sirenko A.A., et al. Phys. Rev. Lett. 84 (2000) 4625
- (2000) Phys. Rev. Lett. , vol.84 , pp. 4625
- Akimov, I.A.¹ Sirenko, A.A.²

43
- 0001357849
- Sirenko A.A., Akimov I.A., et al. Phys. Rev. Lett. 82 (1999) 4500
- (1999) Phys. Rev. Lett. , vol.82 , pp. 4500
- Sirenko, A.A.¹ Akimov, I.A.²

44
- 0002169757
- Toulouse J., DiAntonio P., et al. Phys. Rev. Lett. 68 (1992) 232
- (1992) Phys. Rev. Lett. , vol.68 , pp. 232
- Toulouse, J.¹ DiAntonio, P.²

45
- 36149029537
- Vogt H. J. Phys.: Condens. Matter 7 (1995) 5913
- (1995) J. Phys.: Condens. Matter , vol.7 , pp. 5913
- Vogt, H.¹

46
- 0035943817
- Hubert C., Levy J., Rivkin T.V., et al. Appl. Phys. Lett. 79 (2001) 2058
- (2001) Appl. Phys. Lett. , vol.79 , pp. 2058
- Hubert, C.¹ Levy, J.² Rivkin, T.V.³

47
- 6744271977
- Hubert C., Levy J., Cukauskas E.J., and Kirchoefer S.W. Phys. Rev. Lett. 85 (2000) 1998
- (2000) Phys. Rev. Lett. , vol.85 , pp. 1998
- Hubert, C.¹ Levy, J.² Cukauskas, E.J.³ Kirchoefer, S.W.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.