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Journal of Physics Condensed Matter

Volumn 13, Issue 18, 2001, Pages 4065-4074

Determination of the optical properties of sol-gel-derived BaxSr1-xTiO3 thin film by spectroscopic ellipsometry

(8) Tian, H Y a Luo, W G a Pu, X H a He, X Y a Qiu, P S a Ding, A L c Yang, S H b Mo, D b

a INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

b SUN YAT SEN UNIVERSITY (China)

c NONE

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; BARIUM; BARIUM TITANATE; COMPOSITION; ELLIPSOMETRY; ENERGY GAP; OPTIMIZATION; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SEMICONDUCTING SILICON; SPIN COATING; TEMPERATURE;

BAND GAP ENERGY; SOL-GEL SPIN COATING TECHNIQUE; SPECTROSCOPIC ELLIPSOMETRY;

FERROELECTRIC THIN FILMS;

EID: 0035820782 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/13/18/314 Document Type: Article

Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.