Mesoscopic microwave dispersion in ferroelectric thin films

Physical Review Letters

Volumn 85, Issue 9, 2000, Pages 1998-2001

  Hubert, Charles ^a   Levy, Jeremy ^a   Cukauskas, E J ^b   Kirchoefer, Steven W ^b  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; NEUTRON SCATTERING; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; OPTICAL MICROSCOPY; PERMITTIVITY; RAMAN SPECTROSCOPY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

DIELECTRIC RESONANCE SPECTROSCOPY; MESOSCOPIC MICROWAVE DISPERSION; TEMPERATURE DEPENDENCE; TIME RESOLVED CONFOCAL SCANNING OPTICAL MICROSCOPY;

THIN FILMS;

EID: 6744271977     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1998     Document Type: Article

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