Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control

Nanotechnology

Volumn 19, Issue 7, 2008, Pages

  Varol, A ^a   Gunev, I ^a   Orun, B ^a   Basdogan, C ^a  

^a KOÇ UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELASTIC MODULI; ERROR ANALYSIS; FORCE CONTROL; IMAGE QUALITY; QUALITY CONTROL;

CANTILEVER DYNAMICS; INTERMITTENT-CONTACT MODE; NANO SCANNING; SIMULINK;

NANOTECHNOLOGY;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; MECHANICAL PROBE; PRIORITY JOURNAL; QUALITY CONTROL; QUANTITATIVE STUDY; SIMULATION; YOUNG MODULUS;

EID: 38949161874     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/7/075503     Document Type: Article

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