Imaging stability and average tip-sample force in tapping mode atomic force microscopy

Journal of Applied Physics

Volumn 99, Issue 6, 2006, Pages

  Kowalewski, Tomasz ^a   Legleiter, Justin ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER SPRING CONSTANT; FEEDBACK LOOP; INTEGRAL GAIN; SLOW TRANSIENT RESPONSE;

CANTILEVER BEAMS; COMPUTER SIMULATION; FEEDBACK; Q FACTOR MEASUREMENT; RESONANCE; RESPONSE TIME (COMPUTER SYSTEMS); TOPOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 33645665048     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2175473     Document Type: Article

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