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Volumn 254, Issue 9, 2008, Pages 2748-2754

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Author keywords

Nanostructures; Optical properties; Silicon; Solar cells

Indexed keywords

DISCHARGE LAMPS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SOLAR CELLS; THIN FILMS; X RAY DIFFRACTION;

EID: 38949149378     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.10.014     Document Type: Article
Times cited : (37)

References (29)
  • 27
    • 38949161729 scopus 로고    scopus 로고
    • Statistica 7.1, StaSoft Inc. 1984-2005.
    • Statistica 7.1, StaSoft Inc. 1984-2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.