Direct determination of grain sizes, lattice parameters, and mismatch of porous silicon

Applied Physics Letters

Volumn 81, Issue 1, 2002, Pages 25-27

  Martin Palma R J ^a   Pascual, L ^b   Herrero, P ^b   Martinez Duart J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATRICES; CHARACTERISTIC SIZE; DIRECT DETERMINATION; GRAIN SIZE; INTERPLANAR DISTANCE; PREFERENTIAL ORIENTATION; SI NANOCRYSTAL;

GAUSSIAN DISTRIBUTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE PROCESSING; LATTICE CONSTANTS; LATTICE MISMATCH; NANOCRYSTALS; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

POROUS SILICON;

EID: 79958238208     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1491007     Document Type: Article

References (9)

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