Soft X-ray microscopy of nanomagnetism

Materials Today

Volumn 9, Issue 1-2, 2006, Pages 26-33

  Fischer, Peter ^a   Kim, Dong Hyun ^a   Chao, Weilun ^a   Liddle, J Alexander ^a   Anderson, Erik H ^a   Attwood, David T ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC PROPERTIES; MAGNETIZATION; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY;

NANOMAGNETISM; WAVEGUIDE STRUCTURES;

X RAY DIFFRACTION ANALYSIS;

EID: 29444442776     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(05)71335-3     Document Type: Article

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