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Volumn 4, Issue , 2007, Pages 1979-1984

A fuzzy logic approach for incorporating the effects of managerialactions on semiconductoryield learning

Author keywords

Fuzzy logic; Learning model; Semiconductor; Yield

Indexed keywords

DATA REDUCTION; LEARNING SYSTEMS; SEMICONDUCTOR MATERIALS;

EID: 38049090237     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMLC.2007.4370471     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 1
    • 0000316781 scopus 로고
    • The learning curve and optimal production under uncertainty
    • Majd, S., Pindyck, R. S., "The learning curve and optimal production under uncertainty", Rand J. Economics, Vol. 20, No. 3, pp. 331-343, 1989.
    • (1989) Rand J. Economics , vol.20 , Issue.3 , pp. 331-343
    • Majd, S.1    Pindyck, R.S.2
  • 2
    • 0002201653 scopus 로고
    • The learning curve and competition
    • Spence, A. M., "The learning curve and competition", Bell J. Economics, Vol. 12, pp. 49-70, 1981.
    • (1981) Bell J. Economics , vol.12 , pp. 49-70
    • Spence, A.M.1
  • 3
    • 0030145832 scopus 로고
    • A Bayesian approach to managing learning-curve uncertainty
    • Mazzola, J. B., McCardle, K. F., "A Bayesian approach to managing learning-curve uncertainty", Management Science, Vol. 42, No. 5, pp. 680-692, 1995.
    • (1995) Management Science , vol.42 , Issue.5 , pp. 680-692
    • Mazzola, J.B.1    McCardle, K.F.2
  • 4
    • 33747748218 scopus 로고
    • Identification of learning curve based on possibilistic concepts
    • The Netherlands, Elsevier Science Publishers B. V, pp
    • Watada, J., Tanaka, H., Shimomura, T., "Identification of learning curve based on possibilistic concepts", Applications of Fuzzy Set Theory in Human Factors, The Netherlands, Elsevier Science Publishers B. V., pp. 191-208, 1986.
    • (1986) Applications of Fuzzy Set Theory in Human Factors , pp. 191-208
    • Watada, J.1    Tanaka, H.2    Shimomura, T.3
  • 5
    • 0033360509 scopus 로고    scopus 로고
    • A fuzzy set approach for yield learning modeling in wafer manufacturing
    • Chen, T., Wang, M.-J. J., "A fuzzy set approach for yield learning modeling in wafer manufacturing", IEEE Transactions on Semiconductor Manufacturing, Vol. 12, No. 2, pp. 252-258, 1999.
    • (1999) IEEE Transactions on Semiconductor Manufacturing , vol.12 , Issue.2 , pp. 252-258
    • Chen, T.1    Wang, M.-J.J.2
  • 6
    • 34648828638 scopus 로고    scopus 로고
    • Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure
    • in press
    • Chen, T., "Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure", Computers and Industrial Engineering, 2007 (in press).
    • (2007) Computers and Industrial Engineering
    • Chen, T.1
  • 9
    • 0042386772 scopus 로고    scopus 로고
    • A new accurate yield prediction method for system-LSI embedded memories
    • Shimada Y., Sakurai K., "A new accurate yield prediction method for system-LSI embedded memories", IEEE Transactions on Semiconductor Manufacturing, Vol. 16, No. 3, pp. 436-445, 2003.
    • (2003) IEEE Transactions on Semiconductor Manufacturing , vol.16 , Issue.3 , pp. 436-445
    • Shimada, Y.1    Sakurai, K.2
  • 10
    • 33646421404 scopus 로고    scopus 로고
    • Data mining using genetic programming for construction of a semiconductor manufacturing yield rate prediction system
    • Li, T.-S., Huang, C.-L., Wu, Z.-Y., "Data mining using genetic programming for construction of a semiconductor manufacturing yield rate prediction system", International Journal of Advanced Manufacturing Technology, Vol. 17, pp. 355-361, 2006.
    • (2006) International Journal of Advanced Manufacturing Technology , vol.17 , pp. 355-361
    • Li, T.-S.1    Huang, C.-L.2    Wu, Z.-Y.3
  • 11
    • 27544480786 scopus 로고    scopus 로고
    • Relative control philosophy - balance and continual change for forecasting abnormal quality characteristics in a silicon wafer slicing process
    • Lin C. T., Chang C. W., Chen C. B., "Relative control philosophy - balance and continual change for forecasting abnormal quality characteristics in a silicon wafer slicing process", International Journal of Advanced Manufacturing Technology, Vol. 26, pp. 1109-1114, 2006.
    • (2006) International Journal of Advanced Manufacturing Technology , vol.26 , pp. 1109-1114
    • Lin, C.T.1    Chang, C.W.2    Chen, C.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.