-
1
-
-
0000316781
-
The learning curve and optimal production under uncertainty
-
Majd, S., Pindyck, R. S., "The learning curve and optimal production under uncertainty", Rand J. Economics, Vol. 20, No. 3, pp. 331-343, 1989.
-
(1989)
Rand J. Economics
, vol.20
, Issue.3
, pp. 331-343
-
-
Majd, S.1
Pindyck, R.S.2
-
2
-
-
0002201653
-
The learning curve and competition
-
Spence, A. M., "The learning curve and competition", Bell J. Economics, Vol. 12, pp. 49-70, 1981.
-
(1981)
Bell J. Economics
, vol.12
, pp. 49-70
-
-
Spence, A.M.1
-
3
-
-
0030145832
-
A Bayesian approach to managing learning-curve uncertainty
-
Mazzola, J. B., McCardle, K. F., "A Bayesian approach to managing learning-curve uncertainty", Management Science, Vol. 42, No. 5, pp. 680-692, 1995.
-
(1995)
Management Science
, vol.42
, Issue.5
, pp. 680-692
-
-
Mazzola, J.B.1
McCardle, K.F.2
-
4
-
-
33747748218
-
Identification of learning curve based on possibilistic concepts
-
The Netherlands, Elsevier Science Publishers B. V, pp
-
Watada, J., Tanaka, H., Shimomura, T., "Identification of learning curve based on possibilistic concepts", Applications of Fuzzy Set Theory in Human Factors, The Netherlands, Elsevier Science Publishers B. V., pp. 191-208, 1986.
-
(1986)
Applications of Fuzzy Set Theory in Human Factors
, pp. 191-208
-
-
Watada, J.1
Tanaka, H.2
Shimomura, T.3
-
5
-
-
0033360509
-
A fuzzy set approach for yield learning modeling in wafer manufacturing
-
Chen, T., Wang, M.-J. J., "A fuzzy set approach for yield learning modeling in wafer manufacturing", IEEE Transactions on Semiconductor Manufacturing, Vol. 12, No. 2, pp. 252-258, 1999.
-
(1999)
IEEE Transactions on Semiconductor Manufacturing
, vol.12
, Issue.2
, pp. 252-258
-
-
Chen, T.1
Wang, M.-J.J.2
-
6
-
-
34648828638
-
Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure
-
in press
-
Chen, T., "Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure", Computers and Industrial Engineering, 2007 (in press).
-
(2007)
Computers and Industrial Engineering
-
-
Chen, T.1
-
7
-
-
0031077148
-
Limited yield estimation for visual defect sources
-
Mullenix, P., Zalnoski, J., Kasten, A. J., "Limited yield estimation for visual defect sources", IEEE Transactions on Semiconductor Manufacturing, Vol. 10,No. 1, pp. 17-23, 1997.
-
(1997)
IEEE Transactions on Semiconductor Manufacturing
, vol.10
, Issue.1
, pp. 17-23
-
-
Mullenix, P.1
Zalnoski, J.2
Kasten, A.J.3
-
8
-
-
33645530571
-
Manufacturing performance evaluation for IC products
-
Hsieh K. L., Tong L. I., "Manufacturing performance evaluation for IC products", International Journal of Advanced Manufacturing Technology, Vol. 28, pp. 610-617, 2006.
-
(2006)
International Journal of Advanced Manufacturing Technology
, vol.28
, pp. 610-617
-
-
Hsieh, K.L.1
Tong, L.I.2
-
9
-
-
0042386772
-
A new accurate yield prediction method for system-LSI embedded memories
-
Shimada Y., Sakurai K., "A new accurate yield prediction method for system-LSI embedded memories", IEEE Transactions on Semiconductor Manufacturing, Vol. 16, No. 3, pp. 436-445, 2003.
-
(2003)
IEEE Transactions on Semiconductor Manufacturing
, vol.16
, Issue.3
, pp. 436-445
-
-
Shimada, Y.1
Sakurai, K.2
-
10
-
-
33646421404
-
Data mining using genetic programming for construction of a semiconductor manufacturing yield rate prediction system
-
Li, T.-S., Huang, C.-L., Wu, Z.-Y., "Data mining using genetic programming for construction of a semiconductor manufacturing yield rate prediction system", International Journal of Advanced Manufacturing Technology, Vol. 17, pp. 355-361, 2006.
-
(2006)
International Journal of Advanced Manufacturing Technology
, vol.17
, pp. 355-361
-
-
Li, T.-S.1
Huang, C.-L.2
Wu, Z.-Y.3
-
11
-
-
27544480786
-
Relative control philosophy - balance and continual change for forecasting abnormal quality characteristics in a silicon wafer slicing process
-
Lin C. T., Chang C. W., Chen C. B., "Relative control philosophy - balance and continual change for forecasting abnormal quality characteristics in a silicon wafer slicing process", International Journal of Advanced Manufacturing Technology, Vol. 26, pp. 1109-1114, 2006.
-
(2006)
International Journal of Advanced Manufacturing Technology
, vol.26
, pp. 1109-1114
-
-
Lin, C.T.1
Chang, C.W.2
Chen, C.B.3
-
12
-
-
33645530571
-
Manufacturing performance evaluation for IC products
-
Hsieh K. L., Tong L. I., "Manufacturing performance evaluation for IC products", International Journal of Advanced Manufacturing Technology, Vol. 28, pp. 610-617, 2006.
-
(2006)
International Journal of Advanced Manufacturing Technology
, vol.28
, pp. 610-617
-
-
Hsieh, K.L.1
Tong, L.I.2
-
13
-
-
33845736847
-
Development of a new cluster index for wafer defects
-
Tong L.-I., Wang C. H., Chen D. L., "Development of a new cluster index for wafer defects", International Journal of Advanced Manufacturing Technology, Vol. 31, pp. 705-715, 2007.
-
(2007)
International Journal of Advanced Manufacturing Technology
, vol.31
, pp. 705-715
-
-
Tong, L.-I.1
Wang, C.H.2
Chen, D.L.3
|