Organic materials for active layers in transistors: Study of the electrical stability properties

Materials Science Forum

Volumn 514-516, Issue PART 1, 2006, Pages 33-37

  Gomes, H L ^a   Stallinga, P ^a   De Leeuw, D M ^b  

^a UNIVERSITY OF ALGARVE   (Portugal)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Charge trapping; Organic transistor; Stability

Indexed keywords

CHARGE TRAPPING; PHASE TRANSITIONS; THERMAL EFFECTS;

ACTIVE LAYERS; ORGANIC TRANSISTORS;

FIELD EFFECT TRANSISTORS;

EID: 37849040944     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.514-516.33     Document Type: Conference Paper

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