Comparison of ZnO thin films grown by pulsed laser deposition on sapphire and Si substrates

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 40, Issue 3, 2008, Pages 699-704

  Han, L ^a   Mei, F ^a   Liu, C ^a   Pedro, C ^b   Alves, E ^b  

^a WUHAN UNIVERSITY   (China)

^b INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

Author keywords

Pulsed laser deposition; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; PULSED LASER DEPOSITION; SAPPHIRE; SILICON; X RAY DIFFRACTION; ZINC OXIDE;

CRYSTALLINE QUALITY; POLYCRYSTALLINE BUFFER LAYER; THREADING DISLOCATIONS;

THIN FILMS;

EID: 37349023157     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2007.09.135     Document Type: Article

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