Statistical critical path analysis considering correlations

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 699-704

  Zhan, Yaping ^a   Strojwas, Andrzej J ^a   Sharma, Mahesh ^b   Newmark, David ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; STATISTICAL METHODS;

DELAY MODELS; STATISTICAL TIMING; TIMING VERIFICATION;

CRITICAL PATH ANALYSIS;

EID: 33751393915     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560156     Document Type: Conference Paper

References (9)

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