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Volumn 86, Issue 1, 2007, Pages
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Modeling of deep Si etching in two-frequency capacitively coupled plasma in SF6/O2
a
KEIO UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36348967632
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/86/1/012018 Document Type: Article |
Times cited : (7)
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References (18)
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