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Volumn 86, Issue 1, 2007, Pages

Modeling of deep Si etching in two-frequency capacitively coupled plasma in SF6/O2

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EID: 36348967632     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/86/1/012018     Document Type: Article
Times cited : (7)

References (18)
  • 1
    • 36348957802 scopus 로고
    • Laermer F and Schilp A 1994 U.S. Patent 5501893, Germany Patent DE4241045
    • (1994)
    • Laermer, F.1    Schilp, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.