Four-parameter sine wave fitting by Gram-Schmidt orthogonalization

Measurement: Journal of the International Measurement Confederation

Volumn 41, Issue 1, 2008, Pages 76-87

  Chen, Kui Fu ^a   Xue, Yi Ming ^a  

^a CHINA AGRICULTURAL UNIVERSITY   (China)

Author keywords

Clenshaw's recurrence; Four parameter sine wave; Gram Schmidt orthogonalization; Iteration; Least square error; Robustness

Indexed keywords

ITERATIVE METHODS; PARAMETER ESTIMATION; ROBUSTNESS (CONTROL SYSTEMS);

CLENSHAW'S RECURRENCE; FOUR-PARAMETER SINE WAVE; GRAM-SCHMIDT ORTHOGONALIZATION; LEAST SQUARE ERROR;

MEAN SQUARE ERROR;

EID: 36348939958     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2006.11.016     Document Type: Article

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