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Volumn 19, Issue 3-4, 1998, Pages 231-236

Improved definition of the effective number of bits in ADC testing

Author keywords

Effective Number of Bits (ENOB); Quantization error power

Indexed keywords

BIT ERROR RATE; COMPUTER SIMULATION; ERRORS; WAVEFORM ANALYSIS;

EID: 0032157397     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(98)00011-7     Document Type: Article
Times cited : (11)

References (9)
  • 5
    • 0029698532 scopus 로고    scopus 로고
    • Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
    • Brussels, Belgium, June 4-6
    • N. Giaquinto, A. Trotta, Fast and accurate ADC testing via an enhanced sine wave fitting algorithm, IMTC '96, Brussels, Belgium, June 4-6, 1996.
    • (1996) IMTC '96
    • Giaquinto, N.1    Trotta, A.2
  • 8
    • 0029700263 scopus 로고    scopus 로고
    • Quantization effects in sampling processes
    • Brussels, Belgium, June 4-6
    • D. Bellan, A. Brandolini, A. Gandelli, Quantization effects in sampling processes, IMTC '96, Brussels, Belgium, June 4-6, 1996.
    • (1996) IMTC '96
    • Bellan, D.1    Brandolini, A.2    Gandelli, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.