Four parameter sine fit with less than one cycle of data

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2003, Pages 113-118

  Max, Solomon ^a  

^a LTX Corporation   (United States)

Author keywords

4 Parameter Sine Fit; ADC; Data Acquisition; Data Analysis; SINAD; THD

Indexed keywords

ALGORITHMS; ELECTRIC FREQUENCY CONTROL; HARMONIC DISTORTION; LINEAR EQUATIONS; POLYNOMIAL APPROXIMATION; DATA ACQUISITION; DATA REDUCTION;

SAMPLING FREQUENCY;

ANALOG TO DIGITAL CONVERSION; PARAMETER ESTIMATION;

4 PARAMETER SINE FIT; ADC; FOUR PARAMETER CURVE; POLYNOMIAL FITTINGS; SAMPLING FREQUENCIES; SINAD; SINE-WAVE; THD;

EID: 0037832229     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. IEEE Standard 1057, "IEEE Standard for Digitizing Waveform Recorders," IEEE, New York, 1994.
2. IEEE Standard 1241, "IEEE Standard for Terminology and Test Methods for analog to Digital converters," IEEE, New York, December 2000
3. www.efunda.com/math/taylor series/trig.cfm - Mathematica in Engineering, Wolfram research