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Volumn 26, Issue 3, 1999, Pages 199-205

ADC testing methods

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; STANDARDS;

EID: 0033207839     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(99)00033-0     Document Type: Article
Times cited : (7)

References (15)
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  • 3
    • 0023310205 scopus 로고
    • High-precision sinusoidal frequency estimator based on weighted least square method
    • Yenq Y.C. High-precision sinusoidal frequency estimator based on weighted least square method. IEEE Trans. IM. 36:1987;124-127.
    • (1987) IEEE Trans. IM , vol.36 , pp. 124-127
    • Yenq, Y.C.1
  • 4
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    • Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave
    • Kuffel J., McComb T.R., Malewsky R. Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave. IEEE Trans. IM. 36:1987;418-422.
    • (1987) IEEE Trans. IM , vol.36 , pp. 418-422
    • Kuffel, J.1    McComb, T.R.2    Malewsky, R.3
  • 5
    • 0024123140 scopus 로고
    • Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement
    • Yenq Y.C., Crosby P.B. Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement. IEEE Trans. IM. 37:1988;529-532.
    • (1988) IEEE Trans. IM , vol.37 , pp. 529-532
    • Yenq, Y.C.1    Crosby, P.B.2
  • 6
    • 0024610459 scopus 로고
    • A comparative evaluation of some practical algorithms used in the effective bits test of wave-form recorder
    • McComb T.R., Kuffel J., Le Roux B.C. A comparative evaluation of some practical algorithms used in the effective bits test of wave-form recorder. IEEE Trans. IM. 38:1989;37-42.
    • (1989) IEEE Trans. IM , vol.38 , pp. 37-42
    • McComb, T.R.1    Kuffel, J.2    Le Roux, B.C.3
  • 7
    • 0026204176 scopus 로고
    • Determining ADC effective number of bit via histogram testing
    • Wadgy M.F., Awad S. Determining ADC effective number of bit via histogram testing. IEEE Trans. IM. 40:1991;770-772.
    • (1991) IEEE Trans. IM , vol.40 , pp. 770-772
    • Wadgy, M.F.1    Awad, S.2
  • 9
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities using sine waves
    • Blair J. Histogram measurement of ADC nonlinearities using sine waves. IEEE Trans. IM. 43:1994;384-388.
    • (1994) IEEE Trans. IM , vol.43 , pp. 384-388
    • Blair, J.1
  • 10
    • 0029393925 scopus 로고
    • A/D converter characterization by spectral analysis in dual tone mode
    • Benkais M., Le Masson S., Marchegay P. A/D converter characterization by spectral analysis in dual tone mode. IEEE Trans. IM. 44:1995;940-944.
    • (1995) IEEE Trans. IM , vol.44 , pp. 940-944
    • Benkais, M.1    Le Masson, S.2    Marchegay, P.3
  • 11
    • 0030127008 scopus 로고
    • An improved sine wave fitting procedure for characterizing data acquisition channels
    • Pintelon R., Schoukens J. An improved sine wave fitting procedure for characterizing data acquisition channels. IEEE Trans. IM. 44:1995;588-593.
    • (1995) IEEE Trans. IM , vol.44 , pp. 588-593
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  • 12
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    • Bounds on least-squares four parameters sine-fit errors due to harmonic distortion and noise
    • Deyst J.P., Souders T.M., Solomon O.M. Bounds on least-squares four parameters sine-fit errors due to harmonic distortion and noise. IEEE Trans. IM. 44:1995;637-642.
    • (1995) IEEE Trans. IM , vol.44 , pp. 637-642
    • Deyst, J.P.1    Souders, T.M.2    Solomon, O.M.3
  • 13
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    • Generalized model of the quantization error - A unified approach
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  • 14
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    • A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.