-
2
-
-
0020099734
-
Dynamic testing of waveform recorders
-
Peetz B.E. Dynamic testing of waveform recorders. IEEE Trans. IM. 32:1983;12-17.
-
(1983)
IEEE Trans. IM
, vol.32
, pp. 12-17
-
-
Peetz, B.E.1
-
3
-
-
0023310205
-
High-precision sinusoidal frequency estimator based on weighted least square method
-
Yenq Y.C. High-precision sinusoidal frequency estimator based on weighted least square method. IEEE Trans. IM. 36:1987;124-127.
-
(1987)
IEEE Trans. IM
, vol.36
, pp. 124-127
-
-
Yenq, Y.C.1
-
4
-
-
0022732699
-
Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave
-
Kuffel J., McComb T.R., Malewsky R. Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave. IEEE Trans. IM. 36:1987;418-422.
-
(1987)
IEEE Trans. IM
, vol.36
, pp. 418-422
-
-
Kuffel, J.1
McComb, T.R.2
Malewsky, R.3
-
5
-
-
0024123140
-
Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement
-
Yenq Y.C., Crosby P.B. Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement. IEEE Trans. IM. 37:1988;529-532.
-
(1988)
IEEE Trans. IM
, vol.37
, pp. 529-532
-
-
Yenq, Y.C.1
Crosby, P.B.2
-
6
-
-
0024610459
-
A comparative evaluation of some practical algorithms used in the effective bits test of wave-form recorder
-
McComb T.R., Kuffel J., Le Roux B.C. A comparative evaluation of some practical algorithms used in the effective bits test of wave-form recorder. IEEE Trans. IM. 38:1989;37-42.
-
(1989)
IEEE Trans. IM
, vol.38
, pp. 37-42
-
-
McComb, T.R.1
Kuffel, J.2
Le Roux, B.C.3
-
7
-
-
0026204176
-
Determining ADC effective number of bit via histogram testing
-
Wadgy M.F., Awad S. Determining ADC effective number of bit via histogram testing. IEEE Trans. IM. 40:1991;770-772.
-
(1991)
IEEE Trans. IM
, vol.40
, pp. 770-772
-
-
Wadgy, M.F.1
Awad, S.2
-
9
-
-
0028446234
-
Histogram measurement of ADC nonlinearities using sine waves
-
Blair J. Histogram measurement of ADC nonlinearities using sine waves. IEEE Trans. IM. 43:1994;384-388.
-
(1994)
IEEE Trans. IM
, vol.43
, pp. 384-388
-
-
Blair, J.1
-
10
-
-
0029393925
-
A/D converter characterization by spectral analysis in dual tone mode
-
Benkais M., Le Masson S., Marchegay P. A/D converter characterization by spectral analysis in dual tone mode. IEEE Trans. IM. 44:1995;940-944.
-
(1995)
IEEE Trans. IM
, vol.44
, pp. 940-944
-
-
Benkais, M.1
Le Masson, S.2
Marchegay, P.3
-
11
-
-
0030127008
-
An improved sine wave fitting procedure for characterizing data acquisition channels
-
Pintelon R., Schoukens J. An improved sine wave fitting procedure for characterizing data acquisition channels. IEEE Trans. IM. 44:1995;588-593.
-
(1995)
IEEE Trans. IM
, vol.44
, pp. 588-593
-
-
Pintelon, R.1
Schoukens, J.2
-
12
-
-
0029325357
-
Bounds on least-squares four parameters sine-fit errors due to harmonic distortion and noise
-
Deyst J.P., Souders T.M., Solomon O.M. Bounds on least-squares four parameters sine-fit errors due to harmonic distortion and noise. IEEE Trans. IM. 44:1995;637-642.
-
(1995)
IEEE Trans. IM
, vol.44
, pp. 637-642
-
-
Deyst, J.P.1
Souders, T.M.2
Solomon, O.M.3
-
13
-
-
0030085206
-
Generalized model of the quantization error - A unified approach
-
Hein K., Pacut A. Generalized model of the quantization error - a unified approach. IEEE IM. 45:1996;41-44.
-
(1996)
IEEE IM
, vol.45
, pp. 41-44
-
-
Hein, K.1
Pacut, A.2
-
14
-
-
0031198135
-
A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter
-
Schoukens J., Pintelon R., Vandersteen G. A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter. IEEE Trans. IM. 46:1997;1005-1010.
-
(1997)
IEEE Trans. IM
, vol.46
, pp. 1005-1010
-
-
Schoukens, J.1
Pintelon, R.2
Vandersteen, G.3
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