Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 6, 2000, Pages 1189-1193

  Händel, Peter ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DISCRETE FOURIER TRANSFORMS; ELECTRONIC EQUIPMENT TESTING; GAUSSIAN NOISE (ELECTRONIC); ITERATIVE METHODS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PERFORMANCE; SIGNAL TO NOISE RATIO; STANDARDS;

CRAMER-RAO LOWER BOUND; FOUR PARAMETER SINE WAVE FIT ALGORITHM; NONLINEAR LEAST SQUARES APPROACH; QUANTIZATION NOISE;

ALGORITHMS;

EID: 0034469962     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.893254     Document Type: Article

References (8)

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2. T. R. Mccomb, J. Kuffel, and B. C. Le Roux, "A comparative evaluation of some practical algorithms used in the effective bits test of waveform recorders," IEEE Trans. Instrum. Meas., vol. 38, pp. 37-42, Feb. 1989.
3. IEEE Standard for Digitizing Waveform Recorders, IEEE Std. 1057, 1994.
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8. T. Söderström and P. Stoica, System Identification. Englewood Cliffs, NJ: Prentice-Hall, 1989.