Testing ADCs for static and dynamic INL - Killing two birds with one stone

Computer Standards and Interfaces

Volumn 26, Issue 1, 2004, Pages 15-20

  Wegener, Carsten ^a   Kennedy, Michael Peter ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

ADC testing; FFT; Histogram; Static and dynamic nonlinearities

Indexed keywords

INFORMATION ANALYSIS; INTEGRAL EQUATIONS; INTERFACES (COMPUTER);

HISTOGRAMS;

ANALOG TO DIGITAL CONVERSION;

EID: 0141532051     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(03)00058-8     Document Type: Conference Paper

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