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Volumn 46, Issue 4, 1997, Pages 1026-1030

Sine wave fit algorithm based on total least-squares method with application to ADC effective bits measurement

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CURVE FITTING; ELECTRIC VARIABLES MEASUREMENT; ERROR ANALYSIS; ESTIMATION; LEAST SQUARES APPROXIMATIONS; LINEARIZATION;

EID: 0031197784     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650821     Document Type: Article
Times cited : (51)

References (9)
  • 1
    • 33747791550 scopus 로고
    • IEEE trial-use standard for digitizing wave-form recorders
    • July
    • "IEEE trial-use standard for digitizing wave-form recorders," IEEE Std. 1057, July 1989.
    • (1989) IEEE Std. 1057
  • 2
    • 0020099734 scopus 로고
    • Dynamic testing of wave-form recorder
    • Mar.
    • B. E. Peetz, "Dynamic testing of wave-form recorder," IEEE Trans. Instrum. Meas.. vol. IM-32, pp. 12-17, Mar. 1983.
    • (1983) IEEE Trans. Instrum. Meas. , vol.IM-32 , pp. 12-17
    • Peetz, B.E.1
  • 3
    • 0022732699 scopus 로고
    • Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave
    • June
    • J. Kuffel, T. R. McComb, and R. Malewski, "Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 418-422, June 1987.
    • (1987) IEEE Trans. Instrum. Meas. , vol.IM-36 , pp. 418-422
    • Kuffel, J.1    McComb, T.R.2    Malewski, R.3
  • 4
    • 0024610459 scopus 로고
    • A comparative evaluation of some practical algorithm used in the effective bits test of wave-form record
    • Feb.
    • T. R. Mccomb, J. Kuffel, and B. C. Le Roux, "A comparative evaluation of some practical algorithm used in the effective bits test of wave-form record," IEEE Trans. Instrum. Meas., vol. 38, pp. 37-42, Feb. 1989.
    • (1989) IEEE Trans. Instrum. Meas. , vol.38 , pp. 37-42
    • Mccomb, T.R.1    Kuffel, J.2    Le Roux, B.C.3
  • 5
    • 0023310205 scopus 로고
    • High-precision sinusoidal frequency estimator based on weighted least-square method
    • Mar.
    • Y. C. Jenq, "High-precision sinusoidal frequency estimator based on weighted least-square method," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 124-127, Mar. 1987.
    • (1987) IEEE Trans. Instrum. Meas. , vol.IM-36 , pp. 124-127
    • Jenq, Y.C.1
  • 6
    • 0024123140 scopus 로고
    • Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement
    • Dec.
    • Y. C. Jenq and P. B. Crosby, "Sinewave parameter estimation algorithm with application to wave-form digitizer effective bits measurement," IEEE Trans. Instrum. Meas., vol. 37, pp. 529-532, Dec. 1988.
    • (1988) IEEE Trans. Instrum. Meas. , vol.37 , pp. 529-532
    • Jenq, Y.C.1    Crosby, P.B.2
  • 7
    • 0000333571 scopus 로고
    • An analysis of the total least-squares problem
    • Dec.
    • G. H. Golub and C. F. Van Loan, "An analysis of the total least-squares problem," SIAM J. Numer. Anal., vol. 17, pp. 883-893, Dec. 1980.
    • (1980) SIAM J. Numer. Anal. , vol.17 , pp. 883-893
    • Golub, G.H.1    Van Loan, C.F.2
  • 8
    • 0346784009 scopus 로고
    • Analysis and solution of the nongeneric total least-squares problem
    • July
    • S. Van Huffel and J. Vandewalle, "Analysis and solution of the nongeneric total least-squares problem," SIAM J. Numer. Anal., vol. 9, pp. 360-372, July 1988.
    • (1988) SIAM J. Numer. Anal. , vol.9 , pp. 360-372
    • Van Huffel, S.1    Vandewalle, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.