Microstructure and shape memory behaviour of annealed Ti 51.5Ni(48.5-x)Cux (x = 6.5-20.9) thin films

Philosophical Magazine

Volumn 87, Issue 35, 2007, Pages 5523-5538

  Ishida, A ^a   Sato, M ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MICROSTRUCTURE; PRECIPITATES; SHAPE MEMORY EFFECT; SPUTTERING; TITANIUM COMPOUNDS;

GUINIER-PRESTON ZONES; STRAIN-TEMPERATURE;

AMORPHOUS FILMS;

EID: 36248955504     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701654394     Document Type: Article

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