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Volumn 332, Issue 1-2, 2002, Pages 47-55
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Microstructure and shape memory behavior of Ti51.2(Pd27.0Ni21.8) and Ti49.5(Pd28.5Ni22.0) thin films
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Author keywords
High temperature shape memory effect; Precipitation; Sputtering; Thin films; Ti Pd Ni; Titanium rich
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Indexed keywords
AMORPHOUS MATERIALS;
CRYSTALLIZATION;
MICROSTRUCTURE;
THERMAL EFFECTS;
THIN FILMS;
INTERNAL STRAIN FIELDS;
SHAPE MEMORY EFFECT;
FILM;
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EID: 0036645510
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5093(01)01714-2 Document Type: Article |
Times cited : (41)
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References (22)
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