A method for measuring the effective source coherence in a field emission transmission electron microscope

Applied Surface Science

Volumn 111, Issue , 1997, Pages 174-179

  James, E M ^a   Rodenburg, J M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON GUNS; ELECTRON SOURCES;

SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM);

ELECTRON MICROSCOPES;

EID: 0031550396     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00697-6     Document Type: Article

References (10)

1. L.M. Brown, J. Phys. F 11 (1981) 1.
2. A.V. Crewe, D.N. Eggenberger, J. Wall and L.M. Welter, Rev. Sci, Inst. 39.4 (1967) 576.
3. A.V. Crewe, J. Wall and L.M. Welter, J. Appl. Phys. 39 (1968) 5861.
4. P.D. Nellist, Ph.D. thesis, University of Cambridge (1995).
5. J.C.H. Spence and J.M. Zuo, Electron Microdiffraction (Plenum Press, New York, 1992).
6. J.C.H. Spence and J.M. Cowley, Optik 50 (1978) 2 129.
7. P.D. Nellist and J.M. Rodenburg, Ultramicroscopy 54 (1994) 61.
8. B.C. McCallum, J.M. Rodenburg and P.D. Nellist, Proc. ICEM 13-Paris, 1994, p. 209.
9. E.M. James, B.C. McCallum and J.M. Rodenburg, Inst. Phys. Conf. Ser. 147 8 EMAG95, Birmingham, 1995, p. 277.
10. P.D. Nellist, B.C. McCallum and J.M. Rodenburg, Nature 374 (1995) 630.