High-resolution microscope for tip-enhanced optical processes in ultrahigh vacuum

Review of Scientific Instruments

Volumn 78, Issue 10, 2007, Pages

  Steidtner, Jens ^a   Pettinger, Bruno ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBATES; GOLD; MIRRORS; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; PLATINUM; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; TOPOGRAPHY; ULTRAHIGH VACUUM;

GAS PHASE; HIGH RESOLUTION MICROSCOPES; OPTICAL PROCESSES; TOPOGRAPHIC INFORMATIONS;

MICROSCOPES;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; OPTICS; RAMAN SPECTROMETRY; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; VACUUM;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, SCANNING PROBE; OPTICS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN; VACUUM;

EID: 36048992850     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794227     Document Type: Article

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