On the field enhancement at laser-illuminated scanning probe tips

Single Molecules

Volumn 3, Issue 5-6, 2002, Pages 281-284

  Klein, Stefan ^a   Witting, Tobias ^a   Dickmann, Klaus ^a   Geshev, Pavel ^b   Hietschold, Michael ^c  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b KUTATELADZE INSTITUTE OF THERMOPHYSICS   (Russian Federation)

^c CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Field enhancement; Raman spectroscopy; Scanning probe tip

Indexed keywords

METAL;

ARTICLE; CALCULATION; DIELECTRIC CONSTANT; ELECTROMAGNETIC FIELD; ILLUMINATION; IMAGE ENHANCEMENT; LASER; MATHEMATICAL ANALYSIS; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; THEORY;

EID: 0036968675     PISSN: 14385163     EISSN: None     Source Type: Journal    
DOI: 10.1002/1438-5171(200211)3:5/6<281::AID-SIMO281>3.0.CO;2-C     Document Type: Article

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