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Volumn 200, Issue 12-13, 2006, Pages 4006-4010

Measurement of in-plane elastic constants of crystalline solid films by X-ray diffraction coupled with four-point bending

Author keywords

Bending; Elastic properties; Solid films; X ray diffraction

Indexed keywords

BENDING STRENGTH; ELASTIC MODULI; FILMS; NONDESTRUCTIVE EXAMINATION; POISSON RATIO; SOLIDS; STRESS ANALYSIS; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

EID: 32844467594     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.01.094     Document Type: Article
Times cited : (11)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.