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Volumn 200, Issue 12-13, 2006, Pages 4006-4010
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Measurement of in-plane elastic constants of crystalline solid films by X-ray diffraction coupled with four-point bending
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Author keywords
Bending; Elastic properties; Solid films; X ray diffraction
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Indexed keywords
BENDING STRENGTH;
ELASTIC MODULI;
FILMS;
NONDESTRUCTIVE EXAMINATION;
POISSON RATIO;
SOLIDS;
STRESS ANALYSIS;
THICKNESS MEASUREMENT;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLINE SOLID FILMS;
ELASTIC PROPERTIES;
FOUR-POINT BENDING;
CRYSTALLINE MATERIALS;
BENDING STRENGTH;
CRYSTALLINE MATERIALS;
ELASTIC MODULI;
FILMS;
NONDESTRUCTIVE EXAMINATION;
POISSON RATIO;
SOLIDS;
STRESS ANALYSIS;
THICKNESS MEASUREMENT;
X RAY DIFFRACTION ANALYSIS;
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EID: 32844467594
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.01.094 Document Type: Article |
Times cited : (11)
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References (16)
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