Harmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers

Journal of Applied Crystallography

Volumn 31, Issue 5, 1998, Pages 820-822

  Vetter, W M ^a   Dudley, M ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003108961     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898004683     Document Type: Article

References (6)

1. Brown, D. B., Criss, J. W. & Birks, L. S. (1976). J. Appl. Phys. 47, 3722.
2. Dudley, M., Wang, S., Huang, W., Carter, C. H. Jr, Tsvetkov, V. F. & Fazi, C. (1995). J. Phys. D., 28, A63-A68.
3. Hart, M. (1975). J. Appl. Cryst. 8, 436-444.
4. Miltat, J. (1980). Characterization of Crystal Growth Defects by X-ray Methods, edited by B. K. Tanner & D. K. Bowen, pp. 401-420. New York: Plenum Press.
5. Vetter, W. M., Dudley, M., Wong, T.-F. & Fredrich, J. T. (1995). Mater. Res. Soc. Symp. Proc. 406, 561-566.
6. Yao, G.-D., Dudley, M. & Wu, J. (1990). J. X-ray Sci. Technol. 2, 195-213.