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Volumn 931, Issue , 2007, Pages 525-529
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Metrology for high-frequency nanoelectronics
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Author keywords
Calibration; Carbon nanotubes; Microwaves; Near field electromagnetics; Radio frequency nanoelectronics; Scanning probe microscopy
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Indexed keywords
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EID: 35348823635
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.2799429 Document Type: Conference Paper |
Times cited : (3)
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References (15)
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