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Volumn 931, Issue , 2007, Pages 525-529

Metrology for high-frequency nanoelectronics

Author keywords

Calibration; Carbon nanotubes; Microwaves; Near field electromagnetics; Radio frequency nanoelectronics; Scanning probe microscopy

Indexed keywords


EID: 35348823635     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2799429     Document Type: Conference Paper
Times cited : (3)

References (15)
  • 7
    • 33746561310 scopus 로고    scopus 로고
    • J.-M. Bethoux, H. Happy, G. Dambrine, V. Derycke, M. Goffman, and J.-P. Bourcova. IEEE Electron. Device Lett, 8, 681 (2006).
    • J.-M. Bethoux, H. Happy, G. Dambrine, V. Derycke, M. Goffman, and J.-P. Bourcova. IEEE Electron. Device Lett, 8, 681 (2006).
  • 14
    • 0004099829 scopus 로고    scopus 로고
    • Reading, MA: Addison-Wesley
    • D. M. Pozar, Microwave Engineering, Reading, MA: Addison-Wesley, 2003, p. 205.
    • (2003) Microwave Engineering , pp. 205
    • Pozar, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.