Measurement of specimen thickness by using electron holography and electron dynamic calculation with a transmission electron microscope

Chinese Physics Letters

Volumn 20, Issue 3, 2003, Pages 389-391

  Wang, Yan Guo ^a   Liu, Hong Rong ^b   Yang, Qi Bin ^b   Zhang, Ze ^a  

^a INSTITUTE OF PHYSICS   (China)

^b XIANGTAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ACCURATE MEASUREMENT; DIFFRACTION SIMULATION; DYNAMICS CALCULATIONS; ELECTRON DYNAMICS; MEASUREMENTS OF; OBJECT WAVES; OFF-AXIS ELECTRON HOLOGRAPHY; REFERENCE WAVES; SPECIMEN THICKNESS; TRANSMISSION ELECTRON;

ELECTRON DIFFRACTION;

EID: 0037349538     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/20/3/321     Document Type: Article

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