A new method for the measurement of thickness in single crystals

Micron

Volumn 29, Issue 6, 1998, Pages 425-430

  Lábár, János L ^a   Morgiel, Jerzy ^b  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

Author keywords

ALCHEMI; Convergent beam electron diffraction (CBED); Pattern recognition; Single crystal; Thickness measurement

Indexed keywords

EID: 0344938004     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(98)00025-0     Document Type: Article

References (20)

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