Degradation during ARXPS measurements of polystyrene treated with an oxygen plasma

Surface and Interface Analysis

Volumn 33, Issue 10-11, 2002, Pages 862-868

  Paynter, R W ^a  

^a INRS EMT   (Canada)

Author keywords

ARXPS; Plasma; Polystyrene; Theta probe; X ray degradation; XPS

Indexed keywords

CALCULATIONS; DEGRADATION; ELECTRONIC STRUCTURE; HELIUM; OXYGEN; PLASMAS; POLYSTYRENES; THIN FILMS; X RAY ANALYSIS;

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROMETER; OXYGEN DEPTH PROFILE; OXYGEN PLASMA; THETA PROBE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036806456     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1464     Document Type: Article

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