Enhancement of SEM to scanning LEEM

Surface Science

Volumn 601, Issue 20 SPEC. ISS., 2007, Pages 4768-4773

  Müllerová, Ilona ^a   Matsuda, Kenji ^b   Hrnčiřík, Petr ^a   Frank, Luděk ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b UNIVERSITY OF TOYAMA   (Japan)

Author keywords

Electron emission; Low energy electron diffraction; Scanning low energy electron microscopy; SEM; Surface electronic phenomena

Indexed keywords

CATHODES; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRONS; SIGNAL ANALYSIS;

CATHODE LENS; MULTICHANNEL DETECTION; SCANNING LOW-ENERGY ELECTRON MICROSCOPY; SURFACE ELECTRONIC PHENOMENA;

SCANNING ELECTRON MICROSCOPY;

EID: 35148828102     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.042     Document Type: Article

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