Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Scanning

Volumn 21, Issue 6, 1999, Pages 368-371

  Wells, Oliver C ^a  

^a IBM RESEARCH   (United States)

Author keywords

Bloch waves; Electron backscattering patterns; Electron channeling; Electron channeling patterns; Electron diffraction; Scanning electron microscopy; Wide angle scattering event

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; ELECTRON TRANSPORT; IMAGE ANALYSIS; IMAGE QUALITY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERING; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON SCATTERING; FLUORESCENT SCREENS; MATHEMATICAL MODELS; SINGLE CRYSTALS;

BLOCH WAVES; ELECTRON BACKSCATTERING PATTERNS; ELECTRON CHANNELING PATTERNS;

SCANNING ELECTRON MICROSCOPY;

EID: 0033379886     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950210602     Document Type: Article

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