Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical microscopy probes

Journal of the Korean Physical Society

Volumn 51, Issue 3, 2007, Pages 920-924

  Moon, Jong Seok ^a   Shin, Heungjoo ^a   Mizaikoff, Boris ^a   Kranz, Christine ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Bifunctional scanning probes; Focused ion beam; Nanoelectrodes

Indexed keywords

EID: 34948894469     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.51.920     Document Type: Article

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