Determination of the mean inner potential in III-V semiconductors by electron holography

Ultramicroscopy

Volumn 96, Issue 1, 2003, Pages 11-16

  Kruse, P ^a   Rosenauer, A ^a   Gerthsen, D ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Electron holography; III V semiconductors; Mean inner potential

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON HOLOGRAPHY; IMAGE ANALYSIS; SEMICONDUCTING INDIUM PHOSPHIDE; VOLTAGE MEASUREMENT;

DIFFRACTION IMAGES;

SEMICONDUCTING GALLIUM ARSENIDE;

ACCELERATION; ARTICLE; CONTRAST ENHANCEMENT; ELECTRIC POTENTIAL; ELECTRON; ELECTRON BEAM; ELECTRON DIFFRACTION; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; GEOMETRY; HOLOGRAPHY; IMAGE PROCESSING; MATHEMATICAL COMPUTING; MEASUREMENT; SEMICONDUCTOR;

ALGORITHMS; ARSENICALS; GALLIUM; HOLOGRAPHY; INDIUM; MICROSCOPY, ELECTRON; NEUTRON DIFFRACTION; PHOSPHINES; SEMICONDUCTORS;

EID: 0037410910     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00376-5     Document Type: Article

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