Piezoelectric nonlinearity of Pb(Zr,Ti)O3 thin films probed by scanning force microscopy

Applied Physics Letters

Volumn 81, Issue 16, 2002, Pages 3025-3027

  Shvartsman, V V ^a   Kholkin, A L ^a   Pertsev, N A ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AC FIELD; AS-GROWN; DEPINNING; DOMAIN BOUNDARY; INTERFEROMETRIC MEASUREMENT; MACROSCOPIC BEHAVIORS; MACROSCOPIC RESPONSE; NANO SCALE; PB(ZR , TI)O; PIEZOELECTRIC NONLINEARITY; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC RESPONSE; POLARIZATION STATE; POLARIZATION SWITCHING;

ELECTRIC FIELDS; ELECTRIC SWITCHES; LEAD; POLARIZATION; SCANNING TUNNELING MICROSCOPY; THIN FILMS; ZIRCONIUM;

PIEZOELECTRICITY;

EID: 79956055810     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1514389     Document Type: Article

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