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Volumn 24, Issue 1, 1999, Pages 139-146
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Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients
a a b a c a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION EFFECTS;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTAL SYMMETRY;
CRYSTALLOGRAPHY;
DEPOSITION;
ELECTROSTRICTION;
FERROELECTRIC MATERIALS;
LEAD COMPOUNDS;
PIEZOELECTRIC MATERIALS;
TEXTURES;
COMPOSITION DEPENDENCE;
FILM THICKNESS;
LEAD ZIRCONATE TITANATE;
NEAR MORPHOTROPIC SYMMETRY;
RHOMBOHEDRAL SYMMETRY;
TETRAGONAL SYMMETRY;
THIN FILMS;
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EID: 0033295902
PISSN: 10584587
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1080/10584589908215586 Document Type: Article |
Times cited : (26)
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References (14)
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