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Volumn 24, Issue 1, 1999, Pages 139-146

Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; CRYSTALLOGRAPHY; DEPOSITION; ELECTROSTRICTION; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; PIEZOELECTRIC MATERIALS; TEXTURES;

EID: 0033295902     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908215586     Document Type: Article
Times cited : (26)

References (14)
  • 12
    • 85037798584 scopus 로고    scopus 로고
    • Proc. Int. Symp. Ferroic Domains and Mesoscopic Structures (ISFD-5)
    • To be published
    • A. Kholkine, Proc. Int. Symp. Ferroic Domains and Mesoscopic Structures (ISFD-5) To be published in Ferroelectrics (1998).
    • (1998) Ferroelectrics
    • Kholkine, A.1
  • 14
    • 85037801234 scopus 로고    scopus 로고
    • S. Streiffer, To be published (1999)
    • S. Streiffer, To be published (1999).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.