Investigation of switching behaviour in PbZr0.55Ti 0.45O3 thin films by means of Scanning Probe Microscopy

Ferroelectrics

Volumn 286, Issue , 2003, Pages 291-299

  Shvartsman, V V ^a   Kholkin, A L ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Domain movement; Polarization switching; PZT thin films; Scanning Probe Microscopy

Indexed keywords

GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; POLARIZATION; SWITCHING;

DOMAIN MOVEMENT; POLARIZATION SWITCHING; PZT THIN FILMS; SCANNING PROBE MICROSCOPY;

LEAD COMPOUNDS;

EID: 33746274941     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390206482     Document Type: Conference Paper

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